Modeling and Simulation of Laser Lift-off Process for LED's Substrates

Liuxi Tan, Jia Li, Sheng Liu
{"title":"Modeling and Simulation of Laser Lift-off Process for LED's Substrates","authors":"Liuxi Tan, Jia Li, Sheng Liu","doi":"10.1109/ICEPT.2007.4441496","DOIUrl":null,"url":null,"abstract":"As high power LEDs develop rapidly, sapphire substrate on which LED's chips are grown, cannot meet the needs of the increasing performance any longer. Therefore, transfer of the devices from the former sapphire substrates to more thermally and electrically conductive receptor substrates is recommended. Laser peeling has been a new technology of separating films of GaN from the substrate on which they are grown. Experience shows that the films can be debonded intactly when the laser parameters are well controlled. In this contribution, the mechanics of the laser-assisted debonding of GaN films on sapphire, silicon and copper substrates is considered so that the specific parameters can be optimized in order to achieve a feasible process scheme that may be used in the industry. During the simulation, the knowledge of interfacial crack generation between dissimilar materials is considered to be the essential principle of the process of \"liftoff\". Failure of the interfaces results in the debonding. Whatever, the films of chips should not be damaged in the duration of the \"lift-off\" process. A few important issues such as temperature distribution, stress distribution and energy release rate are raised in terms of examining whether the films are likely to be damaged.","PeriodicalId":325619,"journal":{"name":"2007 8th International Conference on Electronic Packaging Technology","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 8th International Conference on Electronic Packaging Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2007.4441496","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

As high power LEDs develop rapidly, sapphire substrate on which LED's chips are grown, cannot meet the needs of the increasing performance any longer. Therefore, transfer of the devices from the former sapphire substrates to more thermally and electrically conductive receptor substrates is recommended. Laser peeling has been a new technology of separating films of GaN from the substrate on which they are grown. Experience shows that the films can be debonded intactly when the laser parameters are well controlled. In this contribution, the mechanics of the laser-assisted debonding of GaN films on sapphire, silicon and copper substrates is considered so that the specific parameters can be optimized in order to achieve a feasible process scheme that may be used in the industry. During the simulation, the knowledge of interfacial crack generation between dissimilar materials is considered to be the essential principle of the process of "liftoff". Failure of the interfaces results in the debonding. Whatever, the films of chips should not be damaged in the duration of the "lift-off" process. A few important issues such as temperature distribution, stress distribution and energy release rate are raised in terms of examining whether the films are likely to be damaged.
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LED基板激光提升过程的建模与仿真
随着大功率LED的迅速发展,LED芯片的蓝宝石衬底已经不能满足越来越高的性能要求。因此,建议将器件从以前的蓝宝石衬底转移到导热性和导电性更高的受体衬底。激光剥离是一种将氮化镓薄膜从其生长的衬底上分离出来的新技术。经验表明,在控制好激光参数的条件下,薄膜可以实现完整的脱粘。在这篇贡献中,考虑了在蓝宝石,硅和铜衬底上激光辅助氮化镓薄膜脱粘的机理,以便可以优化具体参数,以实现可用于工业的可行工艺方案。在模拟过程中,不同材料之间界面裂纹产生的知识被认为是“升空”过程的基本原理。接口失效导致去绑定。无论如何,芯片的薄膜在“起飞”过程中不应被损坏。提出了温度分布、应力分布和能量释放率等几个重要问题,以检验薄膜是否可能被破坏。
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