Technical Research on High Power Silicon Carbide Schottky Barrier Diode

Wang Zuchuan, Yao Haiting, Wu Xiaoye
{"title":"Technical Research on High Power Silicon Carbide Schottky Barrier Diode","authors":"Wang Zuchuan, Yao Haiting, Wu Xiaoye","doi":"10.1109/icsgea.2019.00019","DOIUrl":null,"url":null,"abstract":"This paper reports the research results of high power silicon carbide Schottky barrier diode (SiC SBD) in three aspects, namely the quality and type selection of SiC materials, device structure of SBD and the manufacturing process of SiC devices. Besides, the key processes of manufacturing SiC SBD, i.e. p-type ion implantation and activation process, ohmic contact process, Schottky metal preparation process, and passivation layer preparation process, are analyzed in detail. The paper introduces the preparation method of SiC SBD with a withstand voltage of 1200V, a current density of more than 120A/cm2 and a junction capacitance of less than 0.4pf, proposing a new technical route and process flow for preparation of high-power SiC SBD.","PeriodicalId":201721,"journal":{"name":"2019 International Conference on Smart Grid and Electrical Automation (ICSGEA)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Smart Grid and Electrical Automation (ICSGEA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/icsgea.2019.00019","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper reports the research results of high power silicon carbide Schottky barrier diode (SiC SBD) in three aspects, namely the quality and type selection of SiC materials, device structure of SBD and the manufacturing process of SiC devices. Besides, the key processes of manufacturing SiC SBD, i.e. p-type ion implantation and activation process, ohmic contact process, Schottky metal preparation process, and passivation layer preparation process, are analyzed in detail. The paper introduces the preparation method of SiC SBD with a withstand voltage of 1200V, a current density of more than 120A/cm2 and a junction capacitance of less than 0.4pf, proposing a new technical route and process flow for preparation of high-power SiC SBD.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
大功率碳化硅肖特基势垒二极管技术研究
本文从SiC材料的质量和类型选择、SBD器件的结构和SiC器件的制造工艺三个方面报道了大功率碳化硅肖特基势垒二极管(SiC SBD)的研究成果。详细分析了制备SiC SBD的关键工艺,即p型离子注入活化工艺、欧姆接触工艺、肖特基金属制备工艺和钝化层制备工艺。本文介绍了耐电压1200V、电流密度大于120A/cm2、结电容小于0.4pf的SiC SBD的制备方法,提出了制备大功率SiC SBD的新技术路线和工艺流程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A Summary of Studies on Bilingual Comparable Corpus Research and Application of Verification Error Data Processing of Electricity Meter Based on Grubbs Criterion Exploration of Clipped Barrier Silicon Carbide Schottky Diode Human Face Expression Recognition Based on Deep Learning-Deep Convolutional Neural Network Technical Research on High Power Silicon Carbide Schottky Barrier Diode
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1