{"title":"Highly Accelerated Life Test Evaluation Based on Accelerated Growth Model","authors":"Yuankai Gao, Xiaogang Li, L. Niu","doi":"10.1109/QRS-C.2018.00116","DOIUrl":null,"url":null,"abstract":"Highly accelerated life test has been widely used to improve the quality and reliability of electronic products. However, highly accelerated life test can only qualitatively evaluate reliability of product and can't quantitatively obtain product's reliability. Therefore, in order to improve product's reliability in a short period of time while effectively evaluating the level of product's reliability. This paper addresses the problem of highly accelerated life tests that can't be quantitatively evaluated, applying an evaluation method of the accelerated reliability growth test to highly accelerated life test.","PeriodicalId":426575,"journal":{"name":"QRS Companion","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"QRS Companion","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/QRS-C.2018.00116","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Highly accelerated life test has been widely used to improve the quality and reliability of electronic products. However, highly accelerated life test can only qualitatively evaluate reliability of product and can't quantitatively obtain product's reliability. Therefore, in order to improve product's reliability in a short period of time while effectively evaluating the level of product's reliability. This paper addresses the problem of highly accelerated life tests that can't be quantitatively evaluated, applying an evaluation method of the accelerated reliability growth test to highly accelerated life test.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
