Jinshuo Liu, Yusen Chen, Lanxin Zhang, Juan Deng, Weixin Zhang
{"title":"The Evaluation of the Embedded Software Quality Based on the Binary Code","authors":"Jinshuo Liu, Yusen Chen, Lanxin Zhang, Juan Deng, Weixin Zhang","doi":"10.1109/QRS-C.2016.26","DOIUrl":null,"url":null,"abstract":"The embedded software quality is one of the hottest research aspects with the wide use of the daily embedded devices. This paper proposes a method of evaluating the embedded software quality without high-level language. Firstly, we reverse the binary code into high-level language C. Secondly, the control flow and data flow analysis are utilized to analyze the structure faults of the codes. Thirdly, we create the utilization-oriented fault models and plug in the improved CppCheck tool to chase the specified faults. Fourthly, we propose a software reliability evaluation algorithm based on trigger rate of fault to assess the quality of the embedded software. Our method is evaluated on ST chips of the smart meter, with the corresponding source code. Compared with G-O model, our software reliability evaluation method is useful and simpler.","PeriodicalId":426575,"journal":{"name":"QRS Companion","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"QRS Companion","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/QRS-C.2016.26","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The embedded software quality is one of the hottest research aspects with the wide use of the daily embedded devices. This paper proposes a method of evaluating the embedded software quality without high-level language. Firstly, we reverse the binary code into high-level language C. Secondly, the control flow and data flow analysis are utilized to analyze the structure faults of the codes. Thirdly, we create the utilization-oriented fault models and plug in the improved CppCheck tool to chase the specified faults. Fourthly, we propose a software reliability evaluation algorithm based on trigger rate of fault to assess the quality of the embedded software. Our method is evaluated on ST chips of the smart meter, with the corresponding source code. Compared with G-O model, our software reliability evaluation method is useful and simpler.
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