Interconnection Capacitances Dependence On Further Neighbourhood In The Bus - Experimental Verification Of The Model

A. Jarosz, A. Pfitzner
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引用次数: 3

Abstract

An analytical model, taking into account the further neighbourhood influence on interconnection capacitances was proposed in our previous works (Jarosz, 2002). In this paper a method of experimental verification of those formulas and a test chip designed for the AMS 0.35mum technology are presented. Results of measurements and the correctness of the model are discussed
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母线中互连电容对邻域的依赖——模型的实验验证
在我们以前的工作中提出了一个分析模型,考虑到对互连电容的进一步邻里影响(Jarosz, 2002)。本文给出了这些公式的实验验证方法,并设计了一种针对AMS 0.35 mm工艺的测试芯片。对测量结果和模型的正确性进行了讨论
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