p/sup +/-thin surface layer Schottky-barrier enhanced high speed pseudomorphic Al/sub 0.25/Ga/sub 0.75/As/In/sub 0.15/Ga/sub 0.85/As and Ga/sub 0.5/In/sub 0.5/P/In/sub 0.15/Ga/sub 0.85/As MODFETs

J. Dickmann, M. Berg, T. Hackbarth, R. Deufel, H. Daembkes, F. Scholz, M. Moser
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Abstract

In this paper we report on our investigation of the introduction of a highly p-doped very thin surface layer in combination with GaInP as the wide bandgap material in order to improve the breakdown voltage of GaAs based pseudomorphic MODFETs without deteriorating other device performances. In order to proof the quality of this approach we compare the device performance of the new device with that of a conventional AlGaAs/InGaAs MODFET also having a p/sup +/-surface layer. The device performances of AlGaAs/InGaAs and GaInP/InGaAs devices with 1.8 /spl mu/m gate length are, g/sub mmax/=224mS/mm, 200mS/mm, I/sub DSmax/=300mA/mm, 400 mA/mm, V/sub BrDG/ (I/sub G/=1 mA/mm)=10 V, 14 V, f/sub T/=15 GHz, 12 GHz, f/sub max/=59 GHz, 42 GHz, respectively.<>
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p/sup +/-薄表面层肖特基势垒增强高速伪晶Al/sub 0.25/Ga/sub 0.75/As/In/sub 0.15/Ga/sub 0.85/As和Ga/sub 0.5/In/sub 0.5/ p/ In/sub 0.15/Ga/sub 0.85/As modfet
在本文中,我们研究了引入高p掺杂的极薄表面层与GaInP结合作为宽带隙材料,以提高基于GaAs的伪晶modfet的击穿电压,而不会降低器件的其他性能。为了证明这种方法的质量,我们将新器件的器件性能与具有p/sup +/-表面层的传统AlGaAs/InGaAs MODFET的器件性能进行了比较。栅极长度为1.8 /spl mu/m的AlGaAs/InGaAs和GaInP/InGaAs器件的器件性能分别为:g/sub mmax/=224mS/mm、200mS/mm、I/sub DSmax/=300mA/mm、400 mA/mm、V/sub BrDG/ (I/sub g/ = 1ma /mm)=10 V、14 V、f/sub T/=15 GHz、12 GHz、f/sub max/=59 GHz、42 GHz。
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LT-GaAs-MIS-diode characteristics and equivalent circuit model Reliability of strained quantum well lasers Development of an appropriate model for the design of D-band InP Gunn devices p/sup +/-thin surface layer Schottky-barrier enhanced high speed pseudomorphic Al/sub 0.25/Ga/sub 0.75/As/In/sub 0.15/Ga/sub 0.85/As and Ga/sub 0.5/In/sub 0.5/P/In/sub 0.15/Ga/sub 0.85/As MODFETs Monte Carlo simulation of wide AlGaAs barriers
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