A Framework for Automatic Assembly Program Generator (A^2PG) for Verification and Testing of Processor Cores

K. Bhaskar, M. Prasanth, V. Kamakoti, Kailasnath Maneparambil
{"title":"A Framework for Automatic Assembly Program Generator (A^2PG) for Verification and Testing of Processor Cores","authors":"K. Bhaskar, M. Prasanth, V. Kamakoti, Kailasnath Maneparambil","doi":"10.1109/ATS.2005.10","DOIUrl":null,"url":null,"abstract":"Pre-silicon functional design verification, performance measurements and post-silicon functional testing of processor cores consume the major portion of time and cost investment in any concept-to-silicon design flow. Most of the tools reported in the literature are based on function/faultindependent test generation schemes which cannot be effectively employed for verification or testing of specific functional behavior or for generating inputs for performance measurement of a specific parameter or functional unit in the design. In addition, the crucial bottleneck with existing tools is their scalability with larger designs. It is wellstudied and reported in the literature that for a tool to be scalable with larger designs, it is important to handle the design at higher levels of abstraction, typically, at the RTL level. In this paper, we present an Automatic Assembly Program Generator (A^2 PG), that handles the design at the behavioral RTL level and is based on function-oriented test generation schemes, hence making it scalable and usable for some specific tasks as mentioned above.","PeriodicalId":373563,"journal":{"name":"14th Asian Test Symposium (ATS'05)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th Asian Test Symposium (ATS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2005.10","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Pre-silicon functional design verification, performance measurements and post-silicon functional testing of processor cores consume the major portion of time and cost investment in any concept-to-silicon design flow. Most of the tools reported in the literature are based on function/faultindependent test generation schemes which cannot be effectively employed for verification or testing of specific functional behavior or for generating inputs for performance measurement of a specific parameter or functional unit in the design. In addition, the crucial bottleneck with existing tools is their scalability with larger designs. It is wellstudied and reported in the literature that for a tool to be scalable with larger designs, it is important to handle the design at higher levels of abstraction, typically, at the RTL level. In this paper, we present an Automatic Assembly Program Generator (A^2 PG), that handles the design at the behavioral RTL level and is based on function-oriented test generation schemes, hence making it scalable and usable for some specific tasks as mentioned above.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
一种用于处理器核心验证与测试的自动装配程序生成器(a2pg)框架
在任何从概念到硅的设计流程中,前置硅功能设计验证、性能测量和处理器内核的后硅功能测试消耗了大部分时间和成本投资。文献中报道的大多数工具都是基于功能/故障无关的测试生成方案,不能有效地用于验证或测试特定的功能行为,也不能为设计中特定参数或功能单元的性能测量生成输入。此外,现有工具的关键瓶颈是它们在更大设计中的可伸缩性。在文献中有很好的研究和报道,为了使工具能够与更大的设计进行扩展,在更高的抽象级别(通常是在RTL级别)处理设计是很重要的。在本文中,我们提出了一个自动组装程序生成器(a2pg),它在行为RTL级别处理设计,并基于面向功能的测试生成方案,因此使其可扩展并可用于上述某些特定任务。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation Practical Aspects of Delay Testing for Nanometer Chips State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size A Framework for Automatic Assembly Program Generator (A^2PG) for Verification and Testing of Processor Cores Arithmetic Test Strategy for FFT Processor
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1