M. Myslinski, F. Verbeyst, M. vanden Bossche, D. Schreurs
{"title":"S-functions behavioral model order reduction based on narrowband modulated large-signal network analyzer measurements","authors":"M. Myslinski, F. Verbeyst, M. vanden Bossche, D. Schreurs","doi":"10.1109/ARFTG.2010.5496321","DOIUrl":null,"url":null,"abstract":"In this paper we report for the first time on order reduction applied to S-functions behavioral models. The most dominant model parameters are selected based on the relative uncertainty of their estimated values evaluated against a threshold value. The selection procedure is performed on the same measurement data that is used to extract the model and obtained using a large-signal network analyzer. High level of model order reduction, achieved without any substantial loss of the prediction accuracy, is demonstrated on S-functions extracted for a packaged pHEMT device.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"75th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2010.5496321","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
In this paper we report for the first time on order reduction applied to S-functions behavioral models. The most dominant model parameters are selected based on the relative uncertainty of their estimated values evaluated against a threshold value. The selection procedure is performed on the same measurement data that is used to extract the model and obtained using a large-signal network analyzer. High level of model order reduction, achieved without any substantial loss of the prediction accuracy, is demonstrated on S-functions extracted for a packaged pHEMT device.