Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496320
M. Mirra, M. Marchetti, F. Tessitore, M. Spirito, L. D. de Vreede, L. Betts
In this work we present a novel phase calibration procedure suitable for the waveform reconstruction of closely spaced multi-tone signals. The proposed multi-step calibration approach is based on the phase alignment of the calibration error terms measured with different frequency grids generated by the harmonic phase reference. The method achieves a reduction in the needed multiplication order of the phase reference to cover the intended measurement frequency range. The calibration procedure is implemented on an Agilent PNA-X platform, which uses external hardware extensions, e.g. low frequency bridges, for the accurate measurement of the baseband frequency components.
{"title":"A multi-step phase calibration procedure for closely spaced multi-tone signals","authors":"M. Mirra, M. Marchetti, F. Tessitore, M. Spirito, L. D. de Vreede, L. Betts","doi":"10.1109/ARFTG.2010.5496320","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496320","url":null,"abstract":"In this work we present a novel phase calibration procedure suitable for the waveform reconstruction of closely spaced multi-tone signals. The proposed multi-step calibration approach is based on the phase alignment of the calibration error terms measured with different frequency grids generated by the harmonic phase reference. The method achieves a reduction in the needed multiplication order of the phase reference to cover the intended measurement frequency range. The calibration procedure is implemented on an Agilent PNA-X platform, which uses external hardware extensions, e.g. low frequency bridges, for the accurate measurement of the baseband frequency components.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"175 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124890029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496319
J. Wood, G. Collins
In this article we describe a high-power reflectometer set-up specifically designed for large-signal nVNA measurements for the extraction of X-parameters. The heart of the measurement set-up is an Agilent N5242A PNA-X in nVNA mode. We have measured a Doherty amplifier constructed from a 2-stage, dual-path RF power amplifier IC. This power amplifier can deliver in excess of 100 W in Doherty mode, and these measurements represent the highest power X-parameter extraction reported to date.
{"title":"Investigation of X-parameters measurements on a 100 W Doherty power amplifier","authors":"J. Wood, G. Collins","doi":"10.1109/ARFTG.2010.5496319","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496319","url":null,"abstract":"In this article we describe a high-power reflectometer set-up specifically designed for large-signal nVNA measurements for the extraction of X-parameters. The heart of the measurement set-up is an Agilent N5242A PNA-X in nVNA mode. We have measured a Doherty amplifier constructed from a 2-stage, dual-path RF power amplifier IC. This power amplifier can deliver in excess of 100 W in Doherty mode, and these measurements represent the highest power X-parameter extraction reported to date.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130589413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496329
I. Volokhine
A nonlinear test set is presented to automate absolute calibrations in an on-wafer real time load pull measurement system featuring time domain capability. The absolute power and phase calibrations are essential steps in any nonlinear system and they require, in general, cumbersome manual procedures. The solution is presented to overcome such laborious and error-prone manual procedures with automated absolute calibrations. It makes preparation for on-wafer nonlinear measurement easy and fast by combining commutation of the signal paths and coaxial standards. It includes a power sensor and phase reference device, which are required for on-wafer absolute calibrations. The automation also improves the accuracy and reproducibility of all nonlinear measurements.
{"title":"Automation of absolute phase/power calibrations applied to real time large signal systems","authors":"I. Volokhine","doi":"10.1109/ARFTG.2010.5496329","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496329","url":null,"abstract":"A nonlinear test set is presented to automate absolute calibrations in an on-wafer real time load pull measurement system featuring time domain capability. The absolute power and phase calibrations are essential steps in any nonlinear system and they require, in general, cumbersome manual procedures. The solution is presented to overcome such laborious and error-prone manual procedures with automated absolute calibrations. It makes preparation for on-wafer nonlinear measurement easy and fast by combining commutation of the signal paths and coaxial standards. It includes a power sensor and phase reference device, which are required for on-wafer absolute calibrations. The automation also improves the accuracy and reproducibility of all nonlinear measurements.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121985613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496324
J. Hoversten, M. Roberg, Z. Popovic
This paper presents a high-power high-efficiency PA design method using traditional fundamental-frequency load pull tuners. Harmonic impedance control at the virtual drain is accomplished through the use of tunable pre-matching circuits and full-wave FEM modeling of package parasitics. A 10-mm gate periphery GaN transistor from TriQuint is characterized using the method, and load-pull contours are presented illustrating the dramatic impact of varying 2nd harmonic termination. A 3rd harmonic termination is added to satisfy conditions for class-F-1 load pull, resulting in an 8% efficiency improvement over the best-case 2nd harmonic termination. The method is verified by design and measurement of a 36-W class-F-1 PA prototype at 2.14GHz with 81% drain efficiency and 14.5 dB gain (78% PAE) in pulsed operation.
本文提出了一种利用传统基频负载拉动式调谐器设计大功率高效扩音器的方法。利用可调预匹配电路和封装寄生的全波有限元建模，实现了虚拟漏极处的谐波阻抗控制。使用该方法对TriQuint公司的10mm栅极外围GaN晶体管进行了表征，并给出了负载-拉力轮廓，说明了变化的二次谐波端接的巨大影响。为了满足f -1类负载拉动的条件，增加了一个三次谐波终端，从而比最佳情况下的二次谐波终端效率提高了8%。通过对2.14GHz频率下36w f -1类PA样机的设计和测量，验证了该方法的有效性，脉冲工作时漏极效率为81%，增益为14.5 dB (PAE为78%)。
{"title":"Harmonic load pull of high-power microwave devices using fundamental-only load pull tuners","authors":"J. Hoversten, M. Roberg, Z. Popovic","doi":"10.1109/ARFTG.2010.5496324","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496324","url":null,"abstract":"This paper presents a high-power high-efficiency PA design method using traditional fundamental-frequency load pull tuners. Harmonic impedance control at the virtual drain is accomplished through the use of tunable pre-matching circuits and full-wave FEM modeling of package parasitics. A 10-mm gate periphery GaN transistor from TriQuint is characterized using the method, and load-pull contours are presented illustrating the dramatic impact of varying 2nd harmonic termination. A 3rd harmonic termination is added to satisfy conditions for class-F-1 load pull, resulting in an 8% efficiency improvement over the best-case 2nd harmonic termination. The method is verified by design and measurement of a 36-W class-F-1 PA prototype at 2.14GHz with 81% drain efficiency and 14.5 dB gain (78% PAE) in pulsed operation.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133564076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496316
E. McCune
With the evolution of cellular wireless systems and services, the on-air signals themselves are also undergoing very significant transformations. This paper provides a survey of the active and coming-soon signal types adopted for cellular wireless systems around the world. Focus is on modulation schemes, along with various measures used to characterize the signals before and after power amplification. Cost-benefit tradeoff information is introduced to provide perspective on this signal evolution.
{"title":"Modern cellular wireless signals","authors":"E. McCune","doi":"10.1109/ARFTG.2010.5496316","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496316","url":null,"abstract":"With the evolution of cellular wireless systems and services, the on-air signals themselves are also undergoing very significant transformations. This paper provides a survey of the active and coming-soon signal types adopted for cellular wireless systems around the world. Focus is on modulation schemes, along with various measures used to characterize the signals before and after power amplification. Cost-benefit tradeoff information is introduced to provide perspective on this signal evolution.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124288542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496339
R. Braithwaite
A reduced cost method for the measurement and correction of residual nonlinearities in a digitally predistorted transmitter is proposed. The original system [1] uses a calibration signal applied off-line and a cancellation loop with a square law detector to measure residual nonlinearities. The approach is improved by replacing the calibration signal with the actual signal transmitted, resulting in an on-line measurement system. A further extension integrates several measurements over the input envelope range to adapt a fourth-order polynomial predistorter. Simulation results for a WCDMA input with a 101 carrier configuration show that the proposed approach for measuring residual nonlinearities and estimating predistortion coefficients is effective.
{"title":"Measurement and correction of residual nonlinearities in a digitally predistorted power amplifier","authors":"R. Braithwaite","doi":"10.1109/ARFTG.2010.5496339","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496339","url":null,"abstract":"A reduced cost method for the measurement and correction of residual nonlinearities in a digitally predistorted transmitter is proposed. The original system [1] uses a calibration signal applied off-line and a cancellation loop with a square law detector to measure residual nonlinearities. The approach is improved by replacing the calibration signal with the actual signal transmitted, resulting in an on-line measurement system. A further extension integrates several measurements over the input envelope range to adapt a fourth-order polynomial predistorter. Simulation results for a WCDMA input with a 101 carrier configuration show that the proposed approach for measuring residual nonlinearities and estimating predistortion coefficients is effective.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117199653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496317
D. Bespalko, S. Boumaiza
X-parameter technology provides simulation-based design of non-linear circuits with inherent accuracy that is attributed to measurement-based model extraction. Recent advancements have combined Non-linear Vector Network Analyzer measurements with impedance tuners to compliment the equivalent accuracy of load-pull measurements with the analytic convenience of equation-based large-signal models. This paper investigates the challenges incurred when modeling high-power transistors under variable complex impedance matching conditions. It also compares the predicted performance of the X-parameter model against an independent large-signal model provided by the manufacturer for a 10W transistor. The results show a good correlation between the two models when compared under load-pull impedance modulation.
{"title":"X-parameter measurement challenges for unmatched device characterization","authors":"D. Bespalko, S. Boumaiza","doi":"10.1109/ARFTG.2010.5496317","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496317","url":null,"abstract":"X-parameter technology provides simulation-based design of non-linear circuits with inherent accuracy that is attributed to measurement-based model extraction. Recent advancements have combined Non-linear Vector Network Analyzer measurements with impedance tuners to compliment the equivalent accuracy of load-pull measurements with the analytic convenience of equation-based large-signal models. This paper investigates the challenges incurred when modeling high-power transistors under variable complex impedance matching conditions. It also compares the predicted performance of the X-parameter model against an independent large-signal model provided by the manufacturer for a 10W transistor. The results show a good correlation between the two models when compared under load-pull impedance modulation.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132093733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496330
N. Ridler, M. Salter, P. Goy, S. Caroopen, James Watts, R. Clarke, Y. Lau, D. Linton, R. Dickie, P. Huggard, M. Henry, J. Hesler, S. Barker, J. Stanec
This paper describes an exercise that was undertaken recently to compare reflection and transmission measurements in rectangular metallic waveguide from 110 GHz to 170 GHz (i.e. in the WR-06 waveguide size). The comparison involved making measurements on four devices fitted with ‘precision’ MIL-DTL-3922-67D style flanges. These devices were circulated amongst the nine organizations that chose to participate in the exercise. The comparison took place between August 2008 and September 2009. Results from the exercise are presented in graphical form along with a statistical summary showing average variability for the measurements. The authors believe this is the first time that such a comparison of measurements has been made at these frequencies. These results therefore provide a benchmark for the current state-of-the-art for measurements made in waveguide at these frequencies.
{"title":"Inter-laboratory comparison of reflection and transmission measurements in WR-06 waveguide (110 GHz to 170 GHz)","authors":"N. Ridler, M. Salter, P. Goy, S. Caroopen, James Watts, R. Clarke, Y. Lau, D. Linton, R. Dickie, P. Huggard, M. Henry, J. Hesler, S. Barker, J. Stanec","doi":"10.1109/ARFTG.2010.5496330","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496330","url":null,"abstract":"This paper describes an exercise that was undertaken recently to compare reflection and transmission measurements in rectangular metallic waveguide from 110 GHz to 170 GHz (i.e. in the WR-06 waveguide size). The comparison involved making measurements on four devices fitted with ‘precision’ MIL-DTL-3922-67D style flanges. These devices were circulated amongst the nine organizations that chose to participate in the exercise. The comparison took place between August 2008 and September 2009. Results from the exercise are presented in graphical form along with a statistical summary showing average variability for the measurements. The authors believe this is the first time that such a comparison of measurements has been made at these frequencies. These results therefore provide a benchmark for the current state-of-the-art for measurements made in waveguide at these frequencies.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123834753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496328
U. Arz, K. Kuhlmann
In this paper the effect of uncertainties in the cross-sectional parameters of CPWs and MSLs (e.g. line geometry, substrate material) on the propagation constants is investigated, and fundamental differences between CPW and MSL are illustrated. Since both planar waveguides can be characterized by on-wafer S-parameter measurements, the propagation of uncertainties when using either CPWs or MSLs as calibration standards for the well-known Thru-Reflect-Line calibration procedure is also investigated.
{"title":"Uncertainties in coplanar waveguide and microstrip line standards for on-wafer Thru-Reflect-Line calibrations","authors":"U. Arz, K. Kuhlmann","doi":"10.1109/ARFTG.2010.5496328","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496328","url":null,"abstract":"In this paper the effect of uncertainties in the cross-sectional parameters of CPWs and MSLs (e.g. line geometry, substrate material) on the propagation constants is investigated, and fundamental differences between CPW and MSL are illustrated. Since both planar waveguides can be characterized by on-wafer S-parameter measurements, the propagation of uncertainties when using either CPWs or MSLs as calibration standards for the well-known Thru-Reflect-Line calibration procedure is also investigated.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127361936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-28DOI: 10.1109/ARFTG.2010.5496332
J. Dunsmore, J. Ericsson
Making phase and group delay response measurements on mixers and frequency converters has traditionally been a difficult and complicated process, requiring either modulated-signals (and demodulation), two-tone signals (a special form of modulation) or a system with a reference or re-converting mixer. This paper presents a method to measure the phase response of a mixer on a VNA using a novel phase-measurement method which can measure the input and output phase response independently, computing the transfer response directly. This method relies on a VNA system which utilizes swept-frequency phase-coherent sources and receivers to maintain a common phase reference. A software phase-locking method allows it to operate on frequency converters which have an in-accessible embedded LO, along with a well established method of calibration.
{"title":"A novel method for measuring phase and group delay of mixers without a reference mixer","authors":"J. Dunsmore, J. Ericsson","doi":"10.1109/ARFTG.2010.5496332","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496332","url":null,"abstract":"Making phase and group delay response measurements on mixers and frequency converters has traditionally been a difficult and complicated process, requiring either modulated-signals (and demodulation), two-tone signals (a special form of modulation) or a system with a reference or re-converting mixer. This paper presents a method to measure the phase response of a mixer on a VNA using a novel phase-measurement method which can measure the input and output phase response independently, computing the transfer response directly. This method relies on a VNA system which utilizes swept-frequency phase-coherent sources and receivers to maintain a common phase reference. A software phase-locking method allows it to operate on frequency converters which have an in-accessible embedded LO, along with a well established method of calibration.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130453641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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