A. Zimpeck, Laurent Artola, G. Hubert, C. Meinhardt, F. Kastensmidt, Ricardo Reis
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引用次数: 5
Abstract
Transistor reordering and insertion of decoupling cells are explored to reduce the soft errors susceptibility of circuits designed with FinFETs. This work shows that robustness improves up to 37% and 10% with the respective methodologies.
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