Computer-aided design of self-testable VLSI circuits

Abstract

The authors present the computer-aided self-test system, a CAD tool for designing of self-testable VLSI circuits. Given a register-transfer-level circuit graph and test requirements, CAST augments the circuit with features that make it self-testable. The objective of the CAST procedures is to maximize built-in test hardware in obtained designs. They give an example that illustrates the CAST design process. The CAST system can be easily extended to incorporate other high-level BIST (built-in self-test) techniques, such as the circular self-test path.<>