Cross-Calibration of Various SEE Test Methods Including Pulsed X-rays and Application to SEL and SEU

Abstract

This work is a contribution to the use of alternative SEE test methods. We first report collected charge measurements and simulations in a p-i-n photodiode. The main purpose was to evaluate parameters leading to the correlation between heavy ion broadbeam and microbeam, pulsed X-rays and laser pulses. This study also relies on coupled and analytical simulation to further understand the physical phenomena involved. SEL current shape acquired on a CMOS ASIC were also analyzed and confirm the correlation of these test methods at the temporal scale. These results were then used to study SEU bursts in an SRAM with pulsed X-rays and heavy ions.