{"title":"LADA methodologies to localize embedded memory failure","authors":"B. Yeoh, M.H. Thor, L.S. Gan, Y. Chan, S. Goh","doi":"10.1109/IPFA55383.2022.9915715","DOIUrl":null,"url":null,"abstract":"Dynamic Laser Stimulation (DLS) techniques have met with great success to debug integrated circuit (IC) soft failure. Laser assisted device alteration (LADA) is one of the DLS technique well-established to tackle speed-path failure and analysis of defect-free performance limiting circuits. In this work, we discuss atypical LADA analysis to localize system-on-chip (SOC) memory manufacturing soft and hard defects.","PeriodicalId":378702,"journal":{"name":"2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA55383.2022.9915715","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Dynamic Laser Stimulation (DLS) techniques have met with great success to debug integrated circuit (IC) soft failure. Laser assisted device alteration (LADA) is one of the DLS technique well-established to tackle speed-path failure and analysis of defect-free performance limiting circuits. In this work, we discuss atypical LADA analysis to localize system-on-chip (SOC) memory manufacturing soft and hard defects.
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