Adapting mechanical models to fit electronics

Abstract

Mechanical reliability models for given age parameters are adapted to provide electronic fatigue life distributions for the mission/test profile of stress amplitudes. This process also provides affordable life test plans. The mechanical renewal model is adapted to provide a replacement for mean time between failures (MTBF) as a design requirement and as a key to support analyses. The discussion of mechanical models and their adaptation to electronics include: a Markov deterioration model and adaptation; a interval reliability model and adaptation; an interval reliability example; and a Markov deterioration example.<>