{"title":"Strain rate effect on micromechanical properties of SnAgCu solder wire","authors":"I. Abdullah, R. Ismail, A. Jalar","doi":"10.1109/SMELEC.2014.6920868","DOIUrl":null,"url":null,"abstract":"Dislocation behavior was occurs when an eutectic solder alloy of SnAgCu experiencing different strain at room temperature that require the further analysis in order to relate the physical and microstructure changes towards the mechanical performance of lead free solder. In this study, nanoindentation technique was applied to determine the hardness and modulus on six variant of strain (0.00015 mms-1, 0.0015 mms-1, 0.015 mms-1, 0.15 mms-1, 1.5 mms-1 and 15 mms-1) after tensile test. The P-h curves and the micromechanical parameter namely hardness and residual modulus through nanoindentation test were conducted. The analysis were obtained strain rate sensitivity (m) and stress exponent (n) from dwell time in order to determine the mechanism of grains. The P-h curve result showed the pop-in event at the ranges of 100 nm to 300 nm. The micromechanical properties were show the increment of values at high strain rates. The dominated discontinuity local will occurrence the pop-in event and will activating dislocation distribution.","PeriodicalId":268203,"journal":{"name":"2014 IEEE International Conference on Semiconductor Electronics (ICSE2014)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Conference on Semiconductor Electronics (ICSE2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMELEC.2014.6920868","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Dislocation behavior was occurs when an eutectic solder alloy of SnAgCu experiencing different strain at room temperature that require the further analysis in order to relate the physical and microstructure changes towards the mechanical performance of lead free solder. In this study, nanoindentation technique was applied to determine the hardness and modulus on six variant of strain (0.00015 mms-1, 0.0015 mms-1, 0.015 mms-1, 0.15 mms-1, 1.5 mms-1 and 15 mms-1) after tensile test. The P-h curves and the micromechanical parameter namely hardness and residual modulus through nanoindentation test were conducted. The analysis were obtained strain rate sensitivity (m) and stress exponent (n) from dwell time in order to determine the mechanism of grains. The P-h curve result showed the pop-in event at the ranges of 100 nm to 300 nm. The micromechanical properties were show the increment of values at high strain rates. The dominated discontinuity local will occurrence the pop-in event and will activating dislocation distribution.
当SnAgCu共晶钎料合金在室温下经历不同应变时,会发生位错行为,这需要进一步分析,以便将物理和微观结构变化与无铅钎料的机械性能联系起来。本研究采用纳米压痕技术测定拉伸试验后6种应变(0.00015 mm -1、0.0015 mm -1、0.015 mm -1、0.15 mm -1、1.5 mm -1和15 mm -1)下的硬度和模量。通过纳米压痕测试得到了P-h曲线和显微力学参数硬度和残余模量。为了确定晶粒的形成机理,分析了停留时间的应变率敏感性(m)和应力指数(n)。P-h曲线结果表明,在100 ~ 300 nm范围内出现了弹出事件。在高应变速率下,材料的微观力学性能呈递增趋势。受控制的不连续局部将发生弹出事件并激活位错分布。