Spatial distribution of state densities dominating strain sensitivity of carbon nanotubes

M. Ohnishi, Ken Suzuki, H. Miura
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Abstract

In any electronic devices and sensors, internal strain is induced because of the thermal change or the lattice mismatch between different materials. It is, therefore, expected that when carbon nanotubes (CNTs) are used for electronic devices, their electronic properties are changed caused by the deformation. In this study, we study the mechanism of the change in the band gap of CNTs under the radial strain in terms of state density distribution. We found that the spatial distribution of the state density dominates its strain sensitivity, and thus, the strain sensitivity of electronic properties of CNTs. We also calculated the change in the current through the deformed CNTs. The founding indicates that the state density analysis should be useful for the development of novel electronic devices and nano electro mechanical systems and for assuring their reliable performance.
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碳纳米管应变敏感性的态密度空间分布
在任何电子器件和传感器中,由于不同材料之间的热变化或晶格不匹配而引起内部应变。因此,当碳纳米管(carbon nanotubes, CNTs)用于电子器件时,其电子性能会因变形而发生变化。在本研究中,我们从态密度分布的角度研究了径向应变下CNTs带隙变化的机理。我们发现态密度的空间分布支配着其应变灵敏度,因此,CNTs的电子性能的应变灵敏度。我们还计算了通过变形CNTs的电流变化。这一发现表明,态密度分析对新型电子器件和纳米机电系统的开发以及保证其可靠性能具有重要意义。
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