{"title":"On-chip voltage noise monitor for measuring voltage bounce in power supply lines using a digital tester","authors":"H. Aoki, M. Ikeda, K. Asada","doi":"10.1109/ICMTS.2000.844416","DOIUrl":null,"url":null,"abstract":"With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltage bounce in a power supply line on a chip. We use a voltage comparator circuit to make the output a digital value. We connect this circuit in series to output the results with less pins.","PeriodicalId":447680,"journal":{"name":"ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2000.844416","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 27
Abstract
With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltage bounce in a power supply line on a chip. We use a voltage comparator circuit to make the output a digital value. We connect this circuit in series to output the results with less pins.