Normally-off GaN-on-Si metal-insulator-semiconductor field-effect transistor with 600-V blocking capability at 200 °C

R. Chu, D. Brown, D. Zehnder, Xu Chen, A. Williams, R. Li, M. Chen, S. Newell, K. Boutros
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引用次数: 14

Abstract

We report a GaN-on-Si metal-insulator-semiconductor field-effect transistor (MISFET) with normally-off operation and 600-V blocking capability at 200 °C temperature. The temperature-dependences of threshold voltage, on-resistance, and leakage characteristics are discussed.
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正常关断GaN-on-Si金属绝缘体-半导体场效应晶体管,在200°C下具有600 v阻断能力
我们报道了一种GaN-on-Si金属绝缘体-半导体场效应晶体管(MISFET),在200°C温度下具有正常关闭和600 v阻断能力。讨论了阈值电压、导通电阻和泄漏特性的温度依赖性。
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Vertical leakage/breakdown mechanisms in AlGaN/GaN-on-Si structures Advanced 0.13um smart power technology from 7V to 70V Failure mechanisms of low-voltage trench power MOSFETs under repetitive avalanche conditions Destruction behavior of power diodes beyond the SOA limit Clamped inductive turn-off failure in high-voltage NPT-IGBTs under overloading conditions
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