Sensitivity analysis of the cross-talk in microstrip transmission lines

Abstract

This paper concentrates on the phenomena of cross-talk that takes place in the densely packed microstrip transmission line like structures encountered in VLSI systems. A sensitivity analysis is performed for the normalized inter-layer unbalanced cross-talk voltage with respect to all the dimensional parameters on which it depends and the corresponding sensitivity curves plotted. Based on the calculations and resulting figures, conclusions are drawn for minimizing the cross-talk. The role of the dielectric constant of the substrate in the cross-talk is also mentioned and the ways to minimize cross-talk are discussed.