A first-principles study of carbon-related complexes and energy levels in GaN using heyd-scuseria-ernzerhof hybrid functionals

M. Matsubara, E. Bellotti
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Abstract

Carbon (C) is a common and important impurity in GaN. C doping is employed to obtain semi-insulating buffer layers, which are used for high electron mobility transistors. However, increasing C concentration means the increase of C-related trap levels in GaN, which causes detrimental effects to the device performance. These unexpected C-related trap levels are observed in a number of experiments, but the physical origins of these levels are still unknown. We performed first-principles calculations within density functional theory using hybrid density functionals. Our focuses were on the C-related complexes, about which very little is known so far. From the formation energies of various C-related complexes we obtained thermal and optical activation energies of the trap levels and directly compared them with the experimental values in order to identify the physical origins of the experimentally observed trap levels.
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利用heyd- scusera - erzerhof杂化官能团研究GaN中碳相关配合物和能级的第一性原理
碳(C)是氮化镓中常见的重要杂质。采用C掺杂制备了用于高电子迁移率晶体管的半绝缘缓冲层。然而,C浓度的增加意味着GaN中C相关陷阱水平的增加,这对器件性能产生不利影响。在许多实验中观察到这些意想不到的与c相关的陷阱水平,但这些水平的物理起源仍然未知。我们使用混合密度泛函在密度泛函理论中进行第一性原理计算。我们的重点是与c相关的复合物,迄今为止对其知之甚少。从各种碳相关配合物的形成能中,我们得到了陷阱能级的热活化能和光学活化能,并与实验值进行了直接比较,以确定实验观察到的陷阱能级的物理起源。
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