Integrated Transient Thermal and Mechanical Analysis of Molded PBGA Packages During Thermal Shock

L. Mercado, T. Lee, J. Cook
{"title":"Integrated Transient Thermal and Mechanical Analysis of Molded PBGA Packages During Thermal Shock","authors":"L. Mercado, T. Lee, J. Cook","doi":"10.1109/6040.909627","DOIUrl":null,"url":null,"abstract":"\n During thermal shock, large thermal gradients exist within a molded plastic ball grid array (PBGA) package. The conventional assumption of uniform temperature distribution becomes invalid. In this paper, an integrated thermal-mechanical analysis was performed to evaluate the transient effect of thermal shock. For comparison, an isothermal analysis was also conducted. The computational fluid dynamics (CFD) method was used to obtain the thermal boundary conditions surrounding the package. The heat transfer coefficient obtained through CFD was compared to two analytical solutions. It was found that the analytical values were not acceptable in the time period of interest. Therefore, to obtain the actual maximum die stress, CFD solution has to be used instead of analytical solutions to derive the thermal boundary condition. This boundary condition was then applied to the package and a sequentially coupled heat transfer and thermal stress analysis was performed. The transient analysis has shown that high stresses occur in the die due to thermal shock, which can not be seen under the traditional isothermal assumption. The impact of PBGA package parameters on transient die stress was also studied, including mold thickness and substrate thickness. The results in this paper could be applied to either wire bond or flip-chip PBGA packages.","PeriodicalId":153178,"journal":{"name":"Electronics Manufacturing Issues","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electronics Manufacturing Issues","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/6040.909627","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

During thermal shock, large thermal gradients exist within a molded plastic ball grid array (PBGA) package. The conventional assumption of uniform temperature distribution becomes invalid. In this paper, an integrated thermal-mechanical analysis was performed to evaluate the transient effect of thermal shock. For comparison, an isothermal analysis was also conducted. The computational fluid dynamics (CFD) method was used to obtain the thermal boundary conditions surrounding the package. The heat transfer coefficient obtained through CFD was compared to two analytical solutions. It was found that the analytical values were not acceptable in the time period of interest. Therefore, to obtain the actual maximum die stress, CFD solution has to be used instead of analytical solutions to derive the thermal boundary condition. This boundary condition was then applied to the package and a sequentially coupled heat transfer and thermal stress analysis was performed. The transient analysis has shown that high stresses occur in the die due to thermal shock, which can not be seen under the traditional isothermal assumption. The impact of PBGA package parameters on transient die stress was also studied, including mold thickness and substrate thickness. The results in this paper could be applied to either wire bond or flip-chip PBGA packages.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
成型PBGA封装热冲击过程的瞬态热力学综合分析
在热冲击过程中,模压塑料球栅阵列(PBGA)封装内存在较大的热梯度。传统的温度均匀分布假设不再成立。本文采用综合热-力分析方法来评价热冲击的瞬态效应。为了比较,还进行了等温分析。采用计算流体力学(CFD)方法获得了包体周围的热边界条件。将CFD计算得到的换热系数与两种解析解进行了比较。结果发现,在所研究的时间段内,分析值是不可接受的。因此,为了获得实际的最大模具应力,必须使用CFD解而不是解析解来推导热边界条件。然后将该边界条件应用于封装,并进行了依次耦合的传热和热应力分析。瞬态分析表明,由于热冲击,模具内部产生了高应力,这在传统的等温假设下是看不到的。研究了PBGA封装参数对模具瞬态应力的影响,包括模具厚度和衬底厚度。本文的结果可以应用于线键或倒装的PBGA封装。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Integrated Transient Thermal and Mechanical Analysis of Molded PBGA Packages During Thermal Shock Constitutive and Cyclic Damage Model of 63Sn-37Pb Solder Thermal Issues That Arise due to Manufacturing Processes: Evaluation and Measurement Techniques Process Characterization and the Effect of Process Defects on Flip Chip Reliability Computational Model for Free Abrasive Machining of Brittle Silicon Using a Wiresaw
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1