{"title":"Layered approach to designing system test interfaces","authors":"Man Wah Chiang, Z. Zilic","doi":"10.1109/VTEST.2003.1197671","DOIUrl":null,"url":null,"abstract":"The layered system design approach has shown its strength in the design of the network and other complex systems. In this paper, we apply this approach to the design of system testing interfaces. The system is partitioned into layers to maximize reuse, and ease the development. In this paper, we demonstrate this methodology by designing a low-overhead testing interface and circuitry for the Infiniband Architecture (IBA).","PeriodicalId":292996,"journal":{"name":"Proceedings. 21st VLSI Test Symposium, 2003.","volume":"102 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 21st VLSI Test Symposium, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.2003.1197671","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The layered system design approach has shown its strength in the design of the network and other complex systems. In this paper, we apply this approach to the design of system testing interfaces. The system is partitioned into layers to maximize reuse, and ease the development. In this paper, we demonstrate this methodology by designing a low-overhead testing interface and circuitry for the Infiniband Architecture (IBA).
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