Reflection Residuals of Coaxial Connectors

Abstract

A series of measurements were made on the coaxial connector interface using test fixtures which allow each element to be examined separately. The measurements were made in the time domain in a way that eliminated calibration subtraction of seams and other reflection causing mechanisms. Data is given on seams, slots, chamfers and pin gaps. The contribution of various sized internal chamfers of the female contact is plotted and found to cause a significant reflection as the pin gap becomes very small.