Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323644
M. Maury, G. Simpson
Present millimeter waveguide flanges are major limitation when making precision measurements, or when attempting to build precision devices. New waveguide flange designs for all of the MMW bands which will mate with existing flanges but offer much improved performance are presented. This includes both rectangular and double ridged waveguide. Data showing the improvement is included. Flanges on existing equipment may be upgraded for improved performance.
{"title":"Improved Millimeter Waveguide Flanges Improve VANA Performance","authors":"M. Maury, G. Simpson","doi":"10.1109/ARFTG.1985.323644","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323644","url":null,"abstract":"Present millimeter waveguide flanges are major limitation when making precision measurements, or when attempting to build precision devices. New waveguide flange designs for all of the MMW bands which will mate with existing flanges but offer much improved performance are presented. This includes both rectangular and double ridged waveguide. Data showing the improvement is included. Flanges on existing equipment may be upgraded for improved performance.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114462256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323641
Kenneth Bradley
Criteria for evaluating the stability of a two-port (primarily a single active device) based on the [v,i] terminal parameter sets have been known for years [1]. More recently, Bodway [2] expressed the stability criteria in terms of the S-parameter matrix. Smith developed his chart and published a useful and thorough treatment of his work [3]. However, Smith's rectangular coordinate system origin does not coincide with the center of the chart. White [4] presents the equations for the general contours of the Smith Chart in a easily understood translated coordinate system with its origin at the center of the unity radius chart. This paper brings together the prior work [2,4] and presents a set of equations for finding the real (r and g) circles in the stable operation portion of the Smith Chart and the necessary and sufficient conditions for their existence. A seemingly complicated problem is reduced to simple algebra by a novel change of variables which also highly simplifies the complexity of the expressions manipulated to achieve the desired results.
{"title":"Stabilizing a Potentially Unstable Two-Port","authors":"Kenneth Bradley","doi":"10.1109/ARFTG.1985.323641","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323641","url":null,"abstract":"Criteria for evaluating the stability of a two-port (primarily a single active device) based on the [v,i] terminal parameter sets have been known for years [1]. More recently, Bodway [2] expressed the stability criteria in terms of the S-parameter matrix. Smith developed his chart and published a useful and thorough treatment of his work [3]. However, Smith's rectangular coordinate system origin does not coincide with the center of the chart. White [4] presents the equations for the general contours of the Smith Chart in a easily understood translated coordinate system with its origin at the center of the unity radius chart. This paper brings together the prior work [2,4] and presents a set of equations for finding the real (r and g) circles in the stable operation portion of the Smith Chart and the necessary and sufficient conditions for their existence. A seemingly complicated problem is reduced to simple algebra by a novel change of variables which also highly simplifies the complexity of the expressions manipulated to achieve the desired results.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"109 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127013029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323656
R. Atkinson
{"title":"Software Reusability: A Key Concept for the Future","authors":"R. Atkinson","doi":"10.1109/ARFTG.1985.323656","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323656","url":null,"abstract":"","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132266789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323643
R. Lane
For every frequency there exists an optimum diode mean capacity, ¿(CminCmax). To cover 2-18GHz in .5GHz steps would ideally need 33 diode transfer standards. This is clearly impractical but perhaps 4 diode chips having mean Cj's in a 1:2:4:8 ratio would be practical.
{"title":"A Study of Chip Fixture Characterization Using Varactors","authors":"R. Lane","doi":"10.1109/ARFTG.1985.323643","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323643","url":null,"abstract":"For every frequency there exists an optimum diode mean capacity, ¿(CminCmax). To cover 2-18GHz in .5GHz steps would ideally need 33 diode transfer standards. This is clearly impractical but perhaps 4 diode chips having mean Cj's in a 1:2:4:8 ratio would be practical.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122984790","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323653
Ron Buckles, Dan Snyder
The translation of frequency response measurements to the time domain has become more popular. In our engineering facility, the requests for time domain information have been increasing since its introduction. Engineers have become aware of the wealth of information that can be found in time domain plots. Implementation of time domain calculation is not difficult. Usually a 100-line program is all that is needed to calculate band limited impulse response using a Fast Fourier Transform (FFT). To accomplish this, some study of transform theory is involved, supported with information on sampling. An intuitive approach will be used to help in explaining the digital Fourier transform. Once the basic transform methods are understood, certain methods for conditioning data will be presented to improve the resolution and sensitivity of the transform. Once the basic FPT package has been developed, it can be used in the low pass mode to obtain a TDR type display. This is done by measuring the network in a certain way and inputting the data to the FFT so as to obtain a real-time function. The traditional TDR step response is obtained by using the FFT to compute the inverse Laplace transform after an appropriate data manipulation.
{"title":"Calculaticn and Use of Time Domain Response From Vector Network Analyzer Measurements","authors":"Ron Buckles, Dan Snyder","doi":"10.1109/ARFTG.1985.323653","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323653","url":null,"abstract":"The translation of frequency response measurements to the time domain has become more popular. In our engineering facility, the requests for time domain information have been increasing since its introduction. Engineers have become aware of the wealth of information that can be found in time domain plots. Implementation of time domain calculation is not difficult. Usually a 100-line program is all that is needed to calculate band limited impulse response using a Fast Fourier Transform (FFT). To accomplish this, some study of transform theory is involved, supported with information on sampling. An intuitive approach will be used to help in explaining the digital Fourier transform. Once the basic transform methods are understood, certain methods for conditioning data will be presented to improve the resolution and sensitivity of the transform. Once the basic FPT package has been developed, it can be used in the low pass mode to obtain a TDR type display. This is done by measuring the network in a certain way and inputting the data to the FFT so as to obtain a real-time function. The traditional TDR step response is obtained by using the FFT to compute the inverse Laplace transform after an appropriate data manipulation.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"135 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121381349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323655
S. Hamilton
Recent enhancements in microwave simulator programs, such as EEsof's Touchstone, now permit the designer to use measured data to refine theoretical models. These models can now reflect manufacturing variables and non-ideal elements which will greatly enhance the predictability of future designs. The measured data is supplied through direct interaction with the HP 8510 or 3577 automatic network analyzers. Many exciting applications result -- active device characterization, de-embedding and component measurement for use in upgrading model parasitics to reflect the real world, to name a few. This paper presents the design of a 2 to 6 Ghz four-stage feedback amplifier to illustrate the power of the microwave simulator/automatic network analyzer interface.
{"title":"CAE Interfaces with HP Automatic Network Analyzers","authors":"S. Hamilton","doi":"10.1109/ARFTG.1985.323655","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323655","url":null,"abstract":"Recent enhancements in microwave simulator programs, such as EEsof's Touchstone, now permit the designer to use measured data to refine theoretical models. These models can now reflect manufacturing variables and non-ideal elements which will greatly enhance the predictability of future designs. The measured data is supplied through direct interaction with the HP 8510 or 3577 automatic network analyzers. Many exciting applications result -- active device characterization, de-embedding and component measurement for use in upgrading model parasitics to reflect the real world, to name a few. This paper presents the design of a 2 to 6 Ghz four-stage feedback amplifier to illustrate the power of the microwave simulator/automatic network analyzer interface.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128528251","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323646
Raymond Schwartz, Roy Pescatore
There is litte doubt abour: the accuracy and versatility of the HP8510 Vector Network Analyzer. Hogever, with all its bells and whistles there is still one serious shortcoming very few devices-under-test can be connected directly to the measuring ports. The ability to either calibrate out, or window out, the inteference effects of interseries adapters or interconnecting cables is well documented. Titus, the stability and repeatabilitx of the interconnection between the DUT and the VNA is crucial. This paper introduces a new Instrument Test Cable, with a previously unattainable level of phase, VSWR and insertion loss
{"title":"Instrument Test Cables Extend Measuring Ports of HP8510 VNA","authors":"Raymond Schwartz, Roy Pescatore","doi":"10.1109/ARFTG.1985.323646","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323646","url":null,"abstract":"There is litte doubt abour: the accuracy and versatility of the HP8510 Vector Network Analyzer. Hogever, with all its bells and whistles there is still one serious shortcoming very few devices-under-test can be connected directly to the measuring ports. The ability to either calibrate out, or window out, the inteference effects of interseries adapters or interconnecting cables is well documented. Titus, the stability and repeatabilitx of the interconnection between the DUT and the VNA is crucial. This paper introduces a new Instrument Test Cable, with a previously unattainable level of phase, VSWR and insertion loss","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"179 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116866185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323639
Benjamin Epstein, J. Schepps
A program is described that performs automated testing of spurious signal emmissions from a satellite transponder. This program makes extensive use of the HP-8566 spectrum analyzer in acquiring spur data over a wide frequency range (typically 8 to 20 GHz). The data is compared to spur specification levels that vary both as a function of frequency and bandwidth resolution. All specification levels and spectrum analyzer settings are supplied to the software from ASCII files, thus the program's operation can be readily modified as test requirements are changed. In addition, this approach eliminates operator intervention, hence errors, during execution of the program.
{"title":"Software for Automated Spurious Signal Testing","authors":"Benjamin Epstein, J. Schepps","doi":"10.1109/ARFTG.1985.323639","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323639","url":null,"abstract":"A program is described that performs automated testing of spurious signal emmissions from a satellite transponder. This program makes extensive use of the HP-8566 spectrum analyzer in acquiring spur data over a wide frequency range (typically 8 to 20 GHz). The data is compared to spur specification levels that vary both as a function of frequency and bandwidth resolution. All specification levels and spectrum analyzer settings are supplied to the software from ASCII files, thus the program's operation can be readily modified as test requirements are changed. In addition, this approach eliminates operator intervention, hence errors, during execution of the program.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127157169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323654
H. Stinehelfer
The Hewlett Packard Shared Resource Management System makes a natural environment for the computer-aided microwave engineering work station. The combination of microwave measurements, mirowave design, and microwave analysis as software elements form the basis for microwave engineering. This paper describes the recent software developments and projected enhancements to completely computerize the microwave measurement and design process. The structure of the software modules to perform specific tasks are integrated by the directory and sub-directory libraries of the SRM system. The self-configuring features of the software packages minimize the development cost of new software.
{"title":"Shared Resource Management Work Station for Microwave Engineering","authors":"H. Stinehelfer","doi":"10.1109/ARFTG.1985.323654","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323654","url":null,"abstract":"The Hewlett Packard Shared Resource Management System makes a natural environment for the computer-aided microwave engineering work station. The combination of microwave measurements, mirowave design, and microwave analysis as software elements form the basis for microwave engineering. This paper describes the recent software developments and projected enhancements to completely computerize the microwave measurement and design process. The structure of the software modules to perform specific tasks are integrated by the directory and sub-directory libraries of the SRM system. The self-configuring features of the software packages minimize the development cost of new software.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122725093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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