{"title":"Fractal processes and Weibull statistics","authors":"L.A. Dissdo","doi":"10.1109/ICSD.1989.69269","DOIUrl":null,"url":null,"abstract":"The use of Weibull statistics to study dielectric failure is discussed. Fractal processes involved in breakdown are considered, with particular emphasis on the stochastic progress of a filamentary discharge or conducting path. Here fluctuations in the length at a given time will lead to a Weibull statistic in time. Electrical trees are used to illustrate some of the points discussed.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"199 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1989.69269","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
The use of Weibull statistics to study dielectric failure is discussed. Fractal processes involved in breakdown are considered, with particular emphasis on the stochastic progress of a filamentary discharge or conducting path. Here fluctuations in the length at a given time will lead to a Weibull statistic in time. Electrical trees are used to illustrate some of the points discussed.<>
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