{"title":"Analysis For Vacuo-Thermojunction Characteristics Using Microcomputer","authors":"T. Takeishi, H. Bhat, C. Minamitake","doi":"10.1109/CPEM.1988.671264","DOIUrl":null,"url":null,"abstract":"Fourier analysis technique is adopted to evaluate the dc and ac component in a thermo-electromotive force (TEMF) from a vacuo-thermojunction(VTJ) at ultra-low frequency. In experiments, a digital wavememory(DM) and a microcomputer(MC) are used to minimize a noise by repeating the analysis and averaging each results. A number of repetition required to sufficiently suppress the influence of the noise is given.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671264","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Fourier analysis technique is adopted to evaluate the dc and ac component in a thermo-electromotive force (TEMF) from a vacuo-thermojunction(VTJ) at ultra-low frequency. In experiments, a digital wavememory(DM) and a microcomputer(MC) are used to minimize a noise by repeating the analysis and averaging each results. A number of repetition required to sufficiently suppress the influence of the noise is given.
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