{"title":"The Influence of Temperature on Microstrip Transmission Line Characteristics","authors":"I. Y. Sagiyeva, A. Nosov, R. Surovtsev","doi":"10.1109/EDM49804.2020.9153497","DOIUrl":null,"url":null,"abstract":"A mathematical temperature model of propagation characteristics is presented and its study is performed on the example of a microstrip transmission line. It was found that the maximum change of line characteristics with the separate influence of a temperature change from minus 50°C to 150°C on each of the cross-section parameters of the line does not exceed 1%, and with a simultaneous influence on all parameters 10.76%. It was revealed that the maximum influence on the change of line characteristics is exerted by the change of the substrate relative dielectric permittivity, at which the maximum change in per-unit-length parameters is up to 10%.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"166 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDM49804.2020.9153497","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
A mathematical temperature model of propagation characteristics is presented and its study is performed on the example of a microstrip transmission line. It was found that the maximum change of line characteristics with the separate influence of a temperature change from minus 50°C to 150°C on each of the cross-section parameters of the line does not exceed 1%, and with a simultaneous influence on all parameters 10.76%. It was revealed that the maximum influence on the change of line characteristics is exerted by the change of the substrate relative dielectric permittivity, at which the maximum change in per-unit-length parameters is up to 10%.
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