{"title":"Reliability of commercial relays during life tests with intermediate or low power contact load","authors":"W. Rieder, T. Strof","doi":"10.1109/HOLM.1991.170809","DOIUrl":null,"url":null,"abstract":"The influence of the electrical stress on the contact resistance behavior of several signal and power relays has been investigated during life tests comprising 2 million operations. The results obtained with the aid of a specially developed test device showed characteristic contact resistance patterns for different electrical loads, contact materials, and designs. Under certain load conditions the contact resistance is increased by carbon deposits while both lower and higher loads caused lower contact resistance values.<<ETX>>","PeriodicalId":368900,"journal":{"name":"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1991.170809","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The influence of the electrical stress on the contact resistance behavior of several signal and power relays has been investigated during life tests comprising 2 million operations. The results obtained with the aid of a specially developed test device showed characteristic contact resistance patterns for different electrical loads, contact materials, and designs. Under certain load conditions the contact resistance is increased by carbon deposits while both lower and higher loads caused lower contact resistance values.<>
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