Directed Self-Assembly Based Cut Mask Optimization for Unidirectional Design

Jiaojiao Ou, Bei Yu, Jhih-Rong Gao, D. Pan, M. Preil, A. Latypov
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引用次数: 16

Abstract

Unidirectional design has attracted lots of attention with the scaling down of technology nodes. However, due to the limitation of traditional lithography, printing the randomly distributed dense cuts becomes a big challenge for highly scaled unidirectional layout. Recently directed self-assembly (DSA) has emerged as a promising lithography technique candidate for cut manufacturing because of its ability to form small cylinders inside the guiding templates and the actual pattern size can be greatly reduced. In this paper, we perform a comprehensive study on the DSA cut mask optimization problem. We first formulate it as integer linear programming (ILP) to assign cuts to different guiding templates, targeting at minimum conflicts and line-end extensions. As ILP may not be scalable for very large size problem, we further propose a speed-up method to decompose the problem into smaller ones and solve them separately. We then merge and legalize the solutions without much loss of result quality. The proposed approaches can be easily extended to handle more DSA guiding patterns with complicated shapes. Experimental results show that our methods can significantly reduce the total number of unresolvable patterns and the line-end extensions for the targeted layouts.
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单向设计中基于定向自组装的掩模优化
随着技术节点的缩小,单向设计越来越受到人们的关注。然而,由于传统光刻技术的限制,印刷随机分布的密集切口成为大尺度单向布局的一大挑战。最近,定向自组装(DSA)已成为一种很有前途的光刻技术,用于切割制造,因为它能够在引导模板内形成小圆柱体,并且可以大大减小实际的图案尺寸。在本文中,我们对DSA切割掩模优化问题进行了全面的研究。我们首先将其表述为整数线性规划(ILP),以最小冲突和线端扩展为目标,将切割分配给不同的指导模板。由于ILP对于非常大的问题可能无法扩展,我们进一步提出了一种加速方法,将问题分解为较小的问题并分别解决。然后,我们合并并合法化解决方案,而不会损失太多的结果质量。所提出的方法可以很容易地扩展到处理具有复杂形状的更多DSA引导模式。实验结果表明,我们的方法可以显著减少目标布局的不可解析模式总数和行尾扩展。
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