Enhanced UV-blue response of back illuminated deep double junction CMOS compatible photodiode pixels; a simulation study of high resolution pixel arrays

P. Jansz, S. Hinckley
{"title":"Enhanced UV-blue response of back illuminated deep double junction CMOS compatible photodiode pixels; a simulation study of high resolution pixel arrays","authors":"P. Jansz, S. Hinckley","doi":"10.1109/COMMAD.2012.6472435","DOIUrl":null,"url":null,"abstract":"Simulated backwall U/V blue illuminated double junction photodiode (DJPD) pixels demonstrate excellent crosstalk and sensitivity when substrate, guard and image wells were doped more highly and biased minimally. This configuration minimized each guard and image well depletion region (SCR) width, soSimulated backwall U/V blue illuminated double junction photodiode (DJPD) pixels demonstrate excellent crosstalk and sensitivity when substrate, guard and image wells were doped more highly and biased minimally. This configuration minimized each guard and image well depletion region (SCR) width, so that the image SCR could be presented as close as possible to the back wall without the guard and image SCRs overlapping between and within pixels. that the image SCR could be presented as close as possible to the back wall without the guard and image SCRs overlapping between and within pixels.","PeriodicalId":136573,"journal":{"name":"COMMAD 2012","volume":"104 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"COMMAD 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMMAD.2012.6472435","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Simulated backwall U/V blue illuminated double junction photodiode (DJPD) pixels demonstrate excellent crosstalk and sensitivity when substrate, guard and image wells were doped more highly and biased minimally. This configuration minimized each guard and image well depletion region (SCR) width, soSimulated backwall U/V blue illuminated double junction photodiode (DJPD) pixels demonstrate excellent crosstalk and sensitivity when substrate, guard and image wells were doped more highly and biased minimally. This configuration minimized each guard and image well depletion region (SCR) width, so that the image SCR could be presented as close as possible to the back wall without the guard and image SCRs overlapping between and within pixels. that the image SCR could be presented as close as possible to the back wall without the guard and image SCRs overlapping between and within pixels.
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背照深双结CMOS兼容光电二极管像素增强的紫外-蓝响应高分辨率像素阵列的仿真研究
当衬底、保护和成像阱的掺杂程度较高且偏置最小时,模拟后壁U/V蓝光双结光电二极管(DJPD)像素显示出良好的串扰和灵敏度。这种配置最小化了每个保护和图像阱耗尽区(SCR)宽度,因此当衬底、保护和图像阱掺杂更多且偏置最小时,模拟后壁U/V蓝色照明双结光电二极管(DJPD)像素显示出良好的串扰和灵敏度。这种配置最小化了每个保护和图像井耗尽区(SCR)的宽度,因此图像SCR可以尽可能靠近后壁显示,而不会在像素之间和像素内部重叠保护和图像SCR。图像SCR可以在没有保护的情况下尽可能靠近后墙呈现,并且图像SCR在像素之间和像素内重叠。
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