{"title":"Basic problems of metrology maintenance optical testers and wattmeters","authors":"Y. Machekhin, A.I. Raschektaeva","doi":"10.1109/LFNM.2000.854041","DOIUrl":null,"url":null,"abstract":"The high requirements in measuring accuracy of telecommunication spectral range working equipment demand a new approach to metrological maintenance of low intensity laser photometry. Recently this spectral range has not been studied in photometry. Therefore, the creation of a high-precision means for measurements and the development of methods for checking and calibrating devices become a primary problem, which is necessary to solve in Ukraine in the near future for the field of metrological maintenance. The second problem in formation of metrological maintenance is that it is necessary to create methods close to the international requirements and standards.","PeriodicalId":265943,"journal":{"name":"Proceedings of LFNM'2000. 2nd International Workshop on Laser and Fiber-Optical Networks Modeling (Cat. No.00EX419)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of LFNM'2000. 2nd International Workshop on Laser and Fiber-Optical Networks Modeling (Cat. No.00EX419)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LFNM.2000.854041","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The high requirements in measuring accuracy of telecommunication spectral range working equipment demand a new approach to metrological maintenance of low intensity laser photometry. Recently this spectral range has not been studied in photometry. Therefore, the creation of a high-precision means for measurements and the development of methods for checking and calibrating devices become a primary problem, which is necessary to solve in Ukraine in the near future for the field of metrological maintenance. The second problem in formation of metrological maintenance is that it is necessary to create methods close to the international requirements and standards.
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