M. Kovác, D. Arbet, V. Stopjaková, Michal Sovcík, L. Nagy
{"title":"Investigation of Low-Voltage, Sub-threshold Charge Pump with Parasitics Aware Design Methodology","authors":"M. Kovác, D. Arbet, V. Stopjaková, Michal Sovcík, L. Nagy","doi":"10.1109/DDECS.2019.8724668","DOIUrl":null,"url":null,"abstract":"This paper deals with cross-implementation of analytical and physical fundamentals of ultra low-voltage charge pumps. The analysis is based on precise, general formulas including characteristic parasitic effects valid for linear charge pumps. The parasitic effects are extended by non-linear parasitic capacitances represented as equivalent linear model of a switched transistor itself. The discussion about non-linear and linear behaviour of these parasitics is also included and demonstrated using cross-coupled, dynamic threshold implementation, where the EKV model of transistors has been utilized. The paper also introduced a new design rule for design of charge pumps based on transistors working in sub-threshold region to maximize the power throughput. This is achieved by tuning the operation conditions to the boundary case.","PeriodicalId":197053,"journal":{"name":"2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"206 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2019.8724668","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper deals with cross-implementation of analytical and physical fundamentals of ultra low-voltage charge pumps. The analysis is based on precise, general formulas including characteristic parasitic effects valid for linear charge pumps. The parasitic effects are extended by non-linear parasitic capacitances represented as equivalent linear model of a switched transistor itself. The discussion about non-linear and linear behaviour of these parasitics is also included and demonstrated using cross-coupled, dynamic threshold implementation, where the EKV model of transistors has been utilized. The paper also introduced a new design rule for design of charge pumps based on transistors working in sub-threshold region to maximize the power throughput. This is achieved by tuning the operation conditions to the boundary case.