Effect of device, size, activation energy, temperature, and frequency on memristor switching time

Heba Abunahla, B. Mohammad, D. Homouz
{"title":"Effect of device, size, activation energy, temperature, and frequency on memristor switching time","authors":"Heba Abunahla, B. Mohammad, D. Homouz","doi":"10.1109/ICM.2014.7071806","DOIUrl":null,"url":null,"abstract":"Memristor has a potential to play a big role in the electronics industry as it provides small size, low cost and low power. However, the asymmetry between the ON and OFF switching times of the device hinders the adaption of the device in modern electronics systems. The contribution of this paper is to explore the relationship between the length of the memristor and the switching times. To achieve this the nonlinear model of oxygen vacancies is used. The model also includes coupling with electron transfer. The study shows that tuning the device length can affect the switching time significantly. This paper shows that having a device length of 10-nm gives switching ON and OFF times in the range of 4s - 13ns for applied voltage of 1V - 2.3V. In additon, the obtained OFF/ON switching time ratio is 3x compared to several order of magnitudes reported inliterature for device length of 50-nm. The proposed model is also used to study the effect of changing temperature, activation energy and frequency on memristor switching time.","PeriodicalId":107354,"journal":{"name":"2014 26th International Conference on Microelectronics (ICM)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 26th International Conference on Microelectronics (ICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2014.7071806","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

Memristor has a potential to play a big role in the electronics industry as it provides small size, low cost and low power. However, the asymmetry between the ON and OFF switching times of the device hinders the adaption of the device in modern electronics systems. The contribution of this paper is to explore the relationship between the length of the memristor and the switching times. To achieve this the nonlinear model of oxygen vacancies is used. The model also includes coupling with electron transfer. The study shows that tuning the device length can affect the switching time significantly. This paper shows that having a device length of 10-nm gives switching ON and OFF times in the range of 4s - 13ns for applied voltage of 1V - 2.3V. In additon, the obtained OFF/ON switching time ratio is 3x compared to several order of magnitudes reported inliterature for device length of 50-nm. The proposed model is also used to study the effect of changing temperature, activation energy and frequency on memristor switching time.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
器件、尺寸、激活能、温度和频率对忆阻器开关时间的影响
忆阻器具有体积小、成本低、功耗低等特点,在电子工业中具有重要的应用前景。然而,器件的ON和OFF开关时间之间的不对称阻碍了器件在现代电子系统中的适应。本文的贡献在于探讨了忆阻器长度与开关时间之间的关系。为此,采用了非线性氧空位模型。该模型还包括耦合与电子转移。研究表明,调整器件长度可以显著影响开关时间。本文表明,当器件长度为10nm时,在施加电压为1V - 2.3V时,开关时间在4s - 13ns之间。此外,与文献中报道的器件长度为50 nm时的几个数量级相比,获得的OFF/ON开关时间比是3倍。该模型还用于研究温度、激活能和频率变化对忆阻器开关时间的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Haralick features for GEI-based human gait recognition Haralick feature extraction from time-frequency images for epileptic seizure detection and classification of EEG data LVDS receiver with 7mW consumption at 1.5 Gbps Concatenation of dictionaries for recovery of ECG signals using compressed sensing techniques Effect of device, size, activation energy, temperature, and frequency on memristor switching time
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1