Defects in schottky diodes based on AlGaN/GaN heterostructures

L. Stuchlíková, A. Kosa, J. Benkovska, P. Benko, L. Harmatha, J. Kováč
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引用次数: 3

Abstract

In this paper, the investigation of four types of Schottky-gate structures prepared by low-pressure metal-organic vapour phase epitaxy on sapphire and 4H-SiC substrates, by the deep level transient Fourier spectroscopy is presented. Fifteen deep energy levels have been identified (activation energies: 0.12, 0.26, 0.28, 0.48, 0.50, 0.69, 0.72, 0.75, 0.76, 1.02, 1.23, 1.28, 1.35, 1.57, 1.58 eV). The correlation between deep levels observed on different structure types is discussed.
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基于AlGaN/GaN异质结构的肖特基二极管缺陷
本文利用深能级瞬态傅立叶光谱研究了在蓝宝石和4H-SiC衬底上低压金属-有机气相外延制备的四种肖特基栅结构。已经确定了15个深层能级(活化能:0.12、0.26、0.28、0.48、0.50、0.69、0.72、0.75、0.76、1.02、1.23、1.28、1.35、1.57、1.58 eV)。讨论了在不同构造类型上观测到的深部水平的相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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