{"title":"1/f noise in electrical components caused by the positive thermal feedback in self-generating syste","authors":"H. Seppa, T. Korkolainen, T. Ryhanen","doi":"10.1109/CPEM.1988.671175","DOIUrl":null,"url":null,"abstract":"The positive thermal feedback in a self-generating system is shown to convert thermally induced white noise into 1/f noise. According to this model the slope of the low frequency noise spectrum is very close to unity since the real component evacuates its heat into the three-dimensional space. The theory predicts that the 1/f noise exceeds white noise below the frequency characterizing both the geometric structure of the component and the thermal properties of the surroundings. Consequently, the uncertainty of the measurement is inversely proportional to the physical size of the component or the standard.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"134 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671175","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The positive thermal feedback in a self-generating system is shown to convert thermally induced white noise into 1/f noise. According to this model the slope of the low frequency noise spectrum is very close to unity since the real component evacuates its heat into the three-dimensional space. The theory predicts that the 1/f noise exceeds white noise below the frequency characterizing both the geometric structure of the component and the thermal properties of the surroundings. Consequently, the uncertainty of the measurement is inversely proportional to the physical size of the component or the standard.