Do more camera pixels result in a better picture?

G. Chapman, I. Koren, Z. Koren
{"title":"Do more camera pixels result in a better picture?","authors":"G. Chapman, I. Koren, Z. Koren","doi":"10.1109/IOLTS.2012.6313844","DOIUrl":null,"url":null,"abstract":"A digital camera sensor will incur pixel defects both in fabrication and during its lifetime. While manufacturing defects are corrected in the factory, in-field defects are prohibitively expensive to fix, and can eventually affect the picture quality. During the last 10 years, we have conducted a study of defect development in digital imagers, in which we had access to about 40 cameras and a database of past photos taken by them. The data we collected allows us to quantify characteristics of defect growth. Our investigations have shown that pixel defects are permanent, and their number grows with time. We found that the main type of defect is hot pixels, which are pixels that appear as a bright spot in the image even without any illumination. We also observed that the defects are distributed randomly over the sensor area and are not clustered. By studying past pictures of each given camera we found that the defect growth rate is constant over time. These spatial and temporal characteristics led us to the conclusion that defects are not likely related to material degradation or imperfect fabrication, but are caused by environmental stress such as cosmic rays radiation. Measuring the effect on the defect rate of sensor parameters such as sensor area, number of pixels, pixel size, and sensor technology (CCD - Charge Coupled Device vs. APS - Active Pixel Sensor) yielded a power law, implying that increasing the number of pixels by shrinking the pixel size will result in a higher defect rate and is, therefore, not recommended.","PeriodicalId":246222,"journal":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","volume":"599 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2012.6313844","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

A digital camera sensor will incur pixel defects both in fabrication and during its lifetime. While manufacturing defects are corrected in the factory, in-field defects are prohibitively expensive to fix, and can eventually affect the picture quality. During the last 10 years, we have conducted a study of defect development in digital imagers, in which we had access to about 40 cameras and a database of past photos taken by them. The data we collected allows us to quantify characteristics of defect growth. Our investigations have shown that pixel defects are permanent, and their number grows with time. We found that the main type of defect is hot pixels, which are pixels that appear as a bright spot in the image even without any illumination. We also observed that the defects are distributed randomly over the sensor area and are not clustered. By studying past pictures of each given camera we found that the defect growth rate is constant over time. These spatial and temporal characteristics led us to the conclusion that defects are not likely related to material degradation or imperfect fabrication, but are caused by environmental stress such as cosmic rays radiation. Measuring the effect on the defect rate of sensor parameters such as sensor area, number of pixels, pixel size, and sensor technology (CCD - Charge Coupled Device vs. APS - Active Pixel Sensor) yielded a power law, implying that increasing the number of pixels by shrinking the pixel size will result in a higher defect rate and is, therefore, not recommended.
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相机像素越多,照片就越好吗?
数码相机传感器在制造过程和使用寿命中都会产生像素缺陷。虽然制造缺陷是在工厂纠正的,但现场缺陷的修复成本高昂,最终可能会影响图像质量。在过去的10年里,我们进行了一项关于数码成像仪缺陷发展的研究,在这项研究中,我们访问了大约40台相机和一个由它们拍摄的过去照片的数据库。我们收集的数据允许我们量化缺陷生长的特征。我们的研究表明,像素缺陷是永久性的,它们的数量随着时间的推移而增加。我们发现缺陷的主要类型是热像素,这些像素即使在没有任何照明的情况下也会在图像中出现亮点。我们还观察到,缺陷是随机分布在传感器区域,而不是聚类。通过研究每台给定相机过去的照片,我们发现缺陷的增长速度随时间是恒定的。这些空间和时间特征使我们得出这样的结论:缺陷不太可能与材料降解或制造不完美有关,而是由宇宙射线辐射等环境应力引起的。测量传感器参数对缺陷率的影响,如传感器面积、像素数量、像素大小和传感器技术(CCD -电荷耦合器件与APS -有源像素传感器)产生幂律,这意味着通过缩小像素尺寸来增加像素数量将导致更高的缺陷率,因此不推荐使用。
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