Board-level Functional Test Selection Based on Fault Tree Analysis

Abstract

With the increasing complexity of the circuit board, the cost of the board-level functional test becomes dramatically high. Data-driven-based test selection methods have been widely studied for test-cost reduction. However, existing test selection methods tend to overfit due to overlooking the root causes of faulty boards. To address this issue, a test selection method based on fault tree analysis is proposed. A fault tree oriented to the board-level functional test is established for analyzing the reliability of the board and test items. The reliability analysis result is then utilized to design a test strategy. Three indices are introduced to evaluate the test efficiency and the test quality. Experimental results demonstrate the effectiveness of the proposed method.