{"title":"An Automated System for Testing LSI Memory Chips","authors":"H. D. Schnurmann, L. J. Vidunas, R. M. Peters","doi":"10.1109/DAC.1984.1585837","DOIUrl":null,"url":null,"abstract":"This paper describes a software system for testing LSI memory chips. This system achieves complete automation by customizing test data for a given part number design and by creating an overall test program to be used by a computer-controlled tester in a manufacturing environment. This system encompasses DC testing of the memory product and test sites, AC testing under a variety of timing conditions, and generating a complete set of AC functional test patterns.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585837","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
This paper describes a software system for testing LSI memory chips. This system achieves complete automation by customizing test data for a given part number design and by creating an overall test program to be used by a computer-controlled tester in a manufacturing environment. This system encompasses DC testing of the memory product and test sites, AC testing under a variety of timing conditions, and generating a complete set of AC functional test patterns.
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