Board-level Reliability Performance Comparison of Thin and Thick Ni plating ENEPIG Laminate LGA and BGA Packages

Seok–Phyo Tchun, Joo–Yeop Kim, A. Raj
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Abstract

In the electronic packaging industry, for the past few decades, ENEPIG(Electroless Nickel Electroless Palladium Immersion Gold) plating method has been already widely used for substrates of many different LGA and BGA packages. However, because of chronic quality issues of laminate manufacturing process such as discoloration and corrosion induced from very long process time of Nickel layer plating process, there is a strong demand from laminate substrate suppliers of changing the Nickel layer thickness range from thick 3∼8um to thin 0.08∼0.2um, In this study, we tried to verify the board level reliability performance of Thin Nickel plating ENEPIG laminate packages, comparing with current Thick Nickel plating ENEPIG laminate packages, also compared the performance between LGA and BGA packages.
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薄、厚镀Ni ENEPIG层压板LGA和BGA封装的板级可靠性性能比较
在电子封装行业,在过去的几十年里,ENEPIG(化学镀镍化学镀钯浸金)方法已经广泛应用于许多不同的LGA和BGA封装的基板。然而,由于层压板制造过程中存在长期的质量问题,例如镀镍层工艺的长时间工艺引起的变色和腐蚀,层压板基板供应商强烈要求将镍层厚度范围从厚3 ~ 8um改为薄0.08 ~ 0.2um。在本研究中,我们试图验证薄镀镍ENEPIG层压板封装的板级可靠性性能。比较了目前厚镀镍ENEPIG层压板封装的性能,并比较了LGA和BGA封装的性能。
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