Shih-Hung Lin, Yan-Chih Lu, C.C. Tai, Cheng Tzu-Huan
{"title":"Identification of Edge Recombination from CIGS Solar Cells","authors":"Shih-Hung Lin, Yan-Chih Lu, C.C. Tai, Cheng Tzu-Huan","doi":"10.23919/AM-FPD.2019.8830632","DOIUrl":null,"url":null,"abstract":"CIGS solar cells has high opportunity to achieve high efficiency. The analysis of efficiency loss plays an important role for efficiency boost. The recombination loss often occurs at junction, bulk, surface, and edge position and leads to solar cell efficiency loss. Electroluminescence from defect-related optical transition is applied for defect analysis in CIGS solar cells. The micro-QE measurement is used for edge recombination analysis and reveals the recombination behavior of CIGS solar cells. EQE response at short wavelength region represents the quality of shallow region along light incident direction and used in the edge recombination study as well as EL intensity distribution.","PeriodicalId":129222,"journal":{"name":"2019 26th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 26th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/AM-FPD.2019.8830632","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
CIGS solar cells has high opportunity to achieve high efficiency. The analysis of efficiency loss plays an important role for efficiency boost. The recombination loss often occurs at junction, bulk, surface, and edge position and leads to solar cell efficiency loss. Electroluminescence from defect-related optical transition is applied for defect analysis in CIGS solar cells. The micro-QE measurement is used for edge recombination analysis and reveals the recombination behavior of CIGS solar cells. EQE response at short wavelength region represents the quality of shallow region along light incident direction and used in the edge recombination study as well as EL intensity distribution.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
