{"title":"Modeling and Simulation of Circuit Aging in Scaled CMOS Design","authors":"Yung-Hua Kao","doi":"10.1109/IOLTS.2008.65","DOIUrl":null,"url":null,"abstract":"The document was not made available for publication as part of the conference proceedings.","PeriodicalId":261786,"journal":{"name":"2008 14th IEEE International On-Line Testing Symposium","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 14th IEEE International On-Line Testing Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2008.65","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
The document was not made available for publication as part of the conference proceedings.
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