Evaluation of Metrics to Detect High Impedance Faults Using Real Current Signals

G. N. Lopes, T. S. Menezes, J. Vieira
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Abstract

High Impedance Faults (HIFs) occur due to the contact between an energized conductor and a high impedance surface. Due to the potential dangers caused by HIFs, several methods have been proposed for their identification over the years. Nonetheless, there is still no fully effective technique for their identification. Therefore, this paper proposes indices for evaluating metrics extracted from HIF signals. The goal is to point out the advantages and drawbacks of the selected metrics, aiming to support researchers in developing more effective identification methods. The analyses were performed by using actual HIF signals on soil and vegetation, and the proposed indices are roughness, local inclination, and the global tendency of the metrics. The results revealed relevant characteristics of each metric that can be employed for identifying HIFs, supporting the development of new detection methods.
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利用真实电流信号检测高阻抗故障的度量评估
高阻抗故障(hif)是由于通电导体与高阻抗表面接触而发生的。由于hif引起的潜在危险,多年来已经提出了几种方法来识别hif。然而,目前还没有完全有效的技术来识别它们。因此,本文提出了评价从HIF信号中提取的指标的指标。目标是指出所选指标的优点和缺点,旨在支持研究人员开发更有效的识别方法。利用土壤和植被的实际HIF信号进行分析,提出了指标的粗糙度、局部倾斜度和全局趋势。结果揭示了每个指标的相关特征,可用于识别hif,支持开发新的检测方法。
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