THE SIMULATION MODEL FOR EVALUATING THE ACCURACY OF MEASURING THE ELECTROPHYSICAL PARAMETERS OF METAMATERIALS BY THE METHOD OF SURFACE ELECTROMAGNETIC WAVES
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Abstract
In this paper the simulation model that allows one to evaluating a accuracy and reliability of measuring the local values of electrophysical and geometric parameters of any types of flat-layered samples of metamaterials on a metal substrate by the method of surface electromagnetic waves. The simulation model is implemented on the basis of the CST Microwave studio electrodynamic modeling system and the Matlab system. The results of simulation modeling on the measurement of metamaterial parameters based on rectangular SRR-elements with a region of negative refraction in the frequency range 10.06…10.64 GHz are presented. Numerical verification has shown that the local values of the effective electrophysical parameters of the studied metamaterial differ from the calculated ones by no more than 10 %.
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