{"title":"Defect-tolerant cache memory design","authors":"Dan Lamet, J. Frenzel","doi":"10.1109/VTEST.1993.313331","DOIUrl":null,"url":null,"abstract":"The design of a defect-tolerant control circuit for a set-associative cache memory is presented. The circuit maintains the stack ordering necessary for implementing the LRU replacement algorithm. A discussion of programming techniques for bypassing defective blocks is included.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313331","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
The design of a defect-tolerant control circuit for a set-associative cache memory is presented. The circuit maintains the stack ordering necessary for implementing the LRU replacement algorithm. A discussion of programming techniques for bypassing defective blocks is included.<>
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