On analytic model of multiple vias for high-speed printed circuit board and electric band-gap structures

Lisha Zhang, G. Pan, Zhonghai Guo
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Abstract

We developed a full-wave formulation to model massive number of vias in high-speed printed circuit board (PCB), through silicon via (TSV) and electric band-gap (EBG) structures. This analytic method employs the equivalent magnetic frill array, Galerkin's procedure, image theory and Fourier transform to simplify the problem from a 3D configuration into a 2D frame. Based on Bessel's functions and addition theorem, the final matrix equation is formulated analytically without using any numerical techniques. The new method is purely from the boundary conditions. Consequently, it is simple, versatile, efficient and accurate. Numerical examples demonstrate good agreement between our analytical solution and commercial software (HFSS) for through silicon and PCB vias. The model is also used to study the EBG wall and cavity, for leakage fields.
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高速印刷电路板多通孔及电带隙结构的解析模型
我们开发了一种全波公式来模拟高速印刷电路板(PCB)中的大量通孔,通过硅通孔(TSV)和电带隙(EBG)结构。该解析方法采用等效磁褶边阵列、伽辽金法、图像理论和傅里叶变换,将问题从三维结构简化为二维结构。基于贝塞尔函数和加法定理,在不使用任何数值技术的情况下,对最终的矩阵方程进行了解析表达式。新方法完全从边界条件出发。因此,它简单、通用、高效、准确。数值算例表明,我们的解析解与商业软件(HFSS)在硅通孔和PCB通孔上有很好的一致性。该模型还用于研究EBG壁和腔体的泄漏场。
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