Performance evaluation of checksum-based ABFT

Ahmad A. Al-Yamani, N. Oh, E. McCluskey
{"title":"Performance evaluation of checksum-based ABFT","authors":"Ahmad A. Al-Yamani, N. Oh, E. McCluskey","doi":"10.1109/DFTVS.2001.966800","DOIUrl":null,"url":null,"abstract":"In algorithm-based fault tolerance (ABFT), fault tolerance is tailored to the algorithm performed. Most of the previous studies that compared ABFT schemes considered only error detection and correction capabilities. Some previous studies looked at the overhead but no previous work compared different recovery schemes for data processing applications considering throughput as the main metric. We compare the performance of two recovery schemes: recomputing and ABFT correction, for different error rates. We consider errors that occur during computation as well as those that occur during error detection, location and correction processes. A metric for performance evaluation of different design alternatives is defined. Results show that multiple error correction using ABFT has poorer performance than single error correction even at high error rates. We also present, implement and evaluate early detection in ABFT. In early detection, we try to detect the errors that occur in the checksum calculation before starting the actual computation. Early detection improves throughput in cases of intensive computations and cases of high error rates.","PeriodicalId":187031,"journal":{"name":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.2001.966800","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 28

Abstract

In algorithm-based fault tolerance (ABFT), fault tolerance is tailored to the algorithm performed. Most of the previous studies that compared ABFT schemes considered only error detection and correction capabilities. Some previous studies looked at the overhead but no previous work compared different recovery schemes for data processing applications considering throughput as the main metric. We compare the performance of two recovery schemes: recomputing and ABFT correction, for different error rates. We consider errors that occur during computation as well as those that occur during error detection, location and correction processes. A metric for performance evaluation of different design alternatives is defined. Results show that multiple error correction using ABFT has poorer performance than single error correction even at high error rates. We also present, implement and evaluate early detection in ABFT. In early detection, we try to detect the errors that occur in the checksum calculation before starting the actual computation. Early detection improves throughput in cases of intensive computations and cases of high error rates.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于校验和的ABFT性能评价
在基于算法的容错(ABFT)中,容错是根据所执行的算法进行调整的。以前比较ABFT方案的大多数研究只考虑错误检测和纠正能力。之前的一些研究考察了开销,但没有研究将吞吐量作为主要指标来比较数据处理应用程序的不同恢复方案。我们比较了两种恢复方案的性能:重新计算和ABFT校正,不同的错误率。我们考虑在计算过程中发生的错误以及在错误检测,定位和纠正过程中发生的错误。定义了对不同设计方案进行性能评估的度量。结果表明,即使在高错误率下,ABFT的多次纠错性能也不如单次纠错。我们也提出,实施和评估ABFT的早期检测。在早期检测中,我们尝试在开始实际计算之前检测校验和计算中出现的错误。在密集计算和高错误率的情况下,早期检测可以提高吞吐量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
An on-chip detection circuit for the verification of IC supply connections Unequal error protection codes with two-level burst and capabilities Sensitivity and reliability evaluation for mixed-signal ICs under electromigration and hot-carrier effects Error detection of arithmetic circuits using a residue checker with signed-digit number system Comparison and application of different VHDL-based fault injection techniques
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1