CMOS integrated system for magnetic field monitoring and gradient measurement in MRI environment

Abstract

This paper reports on a standard CMOS integrated system for monitoring the magnetic fields in MRI environments. The sub-micron technology circuit features three horizontal hall devices and their associated electronics that form instrumental chains. Two of them are dedicated to millitesla range magnetic pulse and gradient measurement whereas the third one is for monitoring the strong static field of the MRI setup. The 0.35 mum technology prototype performs 130 muT gradient measurement with 20 muT resolution and can also map static fields as high as 1.5T.