Solder and adhesive free chip assembly using elastic chip sockets: concept, manufacture and preliminary investigations

H. Hesselbom, G. Norberg, S. Dejanovic, D. Haglund
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引用次数: 2

Abstract

Flip Chip connections enormously reduces the amount of solder as compared to mounting packaged devices, apart from also offering superior high frequency properties and placement density. However, when assembling chips to substrates having different thermal expansion coefficient, the solder balls are exposed to strain, the more so the denser the connections (and consequently smaller balls), and the higher the power densities, resulting in wider temperature cycles. This will usually result in loss of contact reliability. Using other materials than solder or using underfills may partially improve the situation, but causes other problems. In order to test another concept maintaining or exceeding the excellent HF and density properties of conventional Flip Chip, while practically eliminating the thermal mismatch problems and providing effortless chip replacement, the Elastic Chip Socket was developed. Silicone elastomer was molded in a precision mold made using anisotropic etching of Si. These structures were subsequently metallized and the metal patterned using electro plated resist. So far functional chip sockets with pin densities of 45 000 pins per cm/sup 2/ (22 500 simultaneously functional connections to a 7 x 7 mm die) and more have been achieved which endure multiple repeated matings and quick temperature cycling between -40 /spl deg/C and +90 /spl deg/C. The following is a summary of the group's achievement this far, Oct. 2003.
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使用弹性芯片插座的无焊料和粘合剂芯片组装:概念,制造和初步调查
与安装封装器件相比,倒装芯片连接大大减少了焊料的数量,此外还提供了卓越的高频特性和放置密度。然而,当将芯片组装到具有不同热膨胀系数的基板上时,焊料球暴露于应变,连接越密(因此球越小),功率密度越高,导致更宽的温度循环。这通常会导致触点可靠性的丧失。使用除焊料以外的其他材料或使用下填料可能会部分改善这种情况,但会引起其他问题。为了测试另一种概念,保持或超过传统倒装芯片的优异高频和密度特性,同时实际上消除了热失配问题,并提供轻松的芯片更换,开发了弹性芯片插座。利用硅的各向异性蚀刻技术在精密模具上对硅弹性体进行了成型。这些结构随后被金属化,金属图案使用电镀抗蚀剂。到目前为止,功能芯片插座的引脚密度为每厘米45 000个引脚/sup 2/(22 500个同时功能连接到7 x 7 mm芯片),并且已经实现了更多的功能,可以承受多次重复配合和在-40 /spl°C和+90 /spl°C之间的快速温度循环。以下是该小组2003年10月至今所取得成就的总结。
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