An ISA-level Accurate Fault Simulator for System-level Fault Analysis

Jiang-Tang Xiao, Ting-Shuo Hsu, C. Fuchs, Yu-Teng Chang, J. Liou, Harry H. Chen
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Abstract

Shrinking feature sizes and cell capacitances, lower operation voltages, and higher operation speeds intensify the influences of radiation-induced soft-errors. To guarantee the functional safety of electronic systems, designers need effective techniques to evaluate designs under errors. Fault injection is one of the standard assessment tools for system dependability. However, because traditional RTL fault simulation has become too slow for modern complex systems, we need abstraction models for early-stage system reliability analysis and design. In this paper, we present an accurate reliability assessment SystemC fault simulator. It features a dynamic mechanism for injecting faults and analyzing the produced errors to evaluate possible fault detection and tolerance designs. Our experimental results show that our simulator can achieve 470x speedup on accurate architecture register fault simulation, validated with the RTL model.
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面向系统级故障分析的isa级精确故障模拟器
缩小特征尺寸和电池容量、降低操作电压和提高操作速度会加剧辐射引起的软误差的影响。为了保证电子系统的功能安全,设计人员需要有效的技术来评估错误下的设计。故障注入是系统可靠性的标准评估工具之一。然而,由于传统的RTL故障仿真对于现代复杂系统来说速度太慢,需要抽象模型来进行早期系统可靠性分析和设计。在本文中,我们提出了一个精确的可靠性评估SystemC故障模拟器。它具有注入故障和分析产生误差的动态机制,以评估可能的故障检测和公差设计。实验结果表明,该仿真器在精确的体系结构配准故障仿真上可以达到470倍的加速,并通过RTL模型进行了验证。
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