Metallized film capacitors operation under the ramp voltage test

Abstract

In this paper, the automated ramp voltage test method for metallized film capacitors was suggested. This method was used to investigate capacitors failure reasons under high electric load. For this purpose, experimental setup and software for experimental data processing were developed. Experimental investigation method was based on high voltage testing of different metallized film capacitors types. It was found that in the case of high electric load, capacitors failure is related to dielectric resistance decreasing due to multiple breakdown events. The conditions of parametric and catastrophic failures of tested capacitors were revealed. The suggested test method also allows to conduct «soft» capacitors treatment of metallized film capacitors.